Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM. Keywords: atomic

• force microscopy (AFM); contact resonance atomic force microscopy (CR-AFM); contact stiffness; defect detection; flexible circuits; subsurface imaging; Introduction With the rapid shrinkage of microelectronic devices, flexible circuits are intensively used while being functionalized as supercapacitors

• been carried out using CR-AFM for subsurface imaging, its application in defect diagnosis for flexible circuits has seldom been reported. Intuitively, the presence of buried metal circuit patterns in the tip-generated stress field will alter the local indentation modulus. This consequently leads to

In-situ monitoring by Raman spectroscopy of the thermal doping of graphene and MoS₂ in O₂-controlled atmosphere

• Aurora Piazza,
• Filippo Giannazzo,
• Gianpiero Buscarino,
• Gabriele Fisichella,
• Antonino La Magna,
• Fabrizio Roccaforte,
• Marco Cannas,
• Franco Mario Gelardi and
• Simonpietro Agnello

Beilstein J. Nanotechnol. 2017, 8, 418–424, doi:10.3762/bjnano.8.44

• application such as thin flexible circuits and interconnecting transparent conductive electrodes for solar cells and/or touch screens [6]. Among the possible dopants for Gr, an easily accessible and promising one is oxygen. It acts as a p-type dopant and can also be activated by thermal treatments [13][14